This is an educational workshop aimed to provide basic knowledge to researchers in some advanced field of experimental techniques. Dual beam FIB/SEM technology provides unsurpassed control and resolution during milling, deposition, and characterization at the nanoscale, thereby enabling high-resolution 3-D prototyping, precise patterning and assembly of features at a nanoscale to the development of next-generation functional nanodevices. The Envoronmental SEM on the other hand has its application mainly to image insulating samples, vacuum-sensitive samples, irradiation-sensitive samples and “wet” samples like biological samples, thin organic films etc.

This workshop is to explore the emerging applications of the dual beam FIB/SEM system and ESEM. The workshop will highlight issues that are relevant to the application of FIB processing and imaging nonconducting samples. It will consists of both lectures and laboratory sessions on both FIB and ESEM techniques. PhD Students, Post doctoral RAs, Scientists and young faculties who are working in this area can apply. The workshop will be restricted to around 20 participants.